Method for imaging liquid and dielectric materials with scanning polarization force microscopy

Patent · Fri Jan 01 00:00:00 EST 1999

OSTI ID:872181

Hu, Jun ^[1]; Ogletree, D Frank ^[2]; Salmeron, Miguel ^[2]; Xiao, Xudong ^[3]

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1. Berkeley, CA
2. El Cerrito, CA
3. Kowloon, CN

The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

• Research Organization: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
• DOE Contract Number: AC03-76SF00098
• Assignee: Regents, University of California (Oakland, CA)
• Patent Number(s): US 5880360
• OSTI ID: 872181
• Country of Publication: United States
• Language: English

Related Subjects

method
imaging
liquid
dielectric
materials
scanning
polarization
force
microscopy
images
forces
surfaces
induced
charged
microscope
sfm
probe
tip
insulators
major
contribution
surface
polarizability
frequencies
mobility
depends
strongly
humidity
inventive
films
droplets
weakly
adsorbed
imaged
liquid film
bed material
dielectric materials
probe tip
dielectric material
force microscope
force microscopy
scanning polarization
scanning force
charged scanning
liquid films
surfaces induced
images dielectric
imaging liquid
polarization forces
polarization force
dielectric polarization
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