Method for imaging liquid and dielectric materials with scanning polarization force microscopy

Patent · 31 December 1998

OSTI ID:872181

Hu, Jun ^[1]; Ogletree, D Frank ^[2]; Salmeron, Miguel ^[2]; Xiao, Xudong ^[3]

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1. Berkeley, CA
2. El Cerrito, CA
3. Kowloon, CN

The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

• Research Organization: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA
• DOE Contract Number: AC03-76SF00098
• Assignee: Regents, University of California (Oakland, CA)
• Patent Number(s): US 5880360
• OSTI ID: 872181
• Country of Publication: United States
• Language: English

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