Method for imaging liquid and dielectric materials with scanning polarization force microscopy
Patent
·
OSTI ID:335454
The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged. 9 figs.
- Research Organization:
- Univ. of California (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC03-76SF00098
- Assignee:
- Univ. of California, Oakland, CA (United States)
- Patent Number(s):
- US 5,880,360/A/
- Application Number:
- PAN: 8-871,424
- OSTI ID:
- 335454
- Resource Relation:
- Other Information: PBD: 9 Mar 1999
- Country of Publication:
- United States
- Language:
- English
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