High resolution energy-sensitive digital X-ray

Patent · Sun Jan 01 00:00:00 EST 1995

OSTI ID:869990

Nygren, David R ^[1]

---

1. Berkeley, CA

An apparatus and method for detecting an x-ray and for determining the depth of penetration of an x-ray into a semiconductor strip detector. In one embodiment, a semiconductor strip detector formed of semiconductor material is disposed in an edge-on orientation towards an x-ray source such that x-rays From the x-ray source are incident upon and substantially perpendicular to the front edge of the semiconductor strip detector. The semiconductor strip detector is formed of a plurality of segments. The segments are coupled together in a collinear arrangement such that the semiconductor strip detector has a length great enough such that substantially all of the x-rays incident on the front edge of the semiconductor strip detector interact with the semiconductor material which forms the semiconductor strip detector. A plurality of electrodes are connected to the semiconductor strip detect or such that each one of the of semiconductor strip detector segments has at least one of the of electrodes coupled thereto. A signal processor is also coupled to each one of the electrodes. The present detector detects an interaction within the semiconductor strip detector, between an x-ray and the semiconductor material, and also indicates the depth of penetration of the x-ray into the semiconductor strip detector at the time of the interaction.

• Research Organization: Univ. of California (United States)
• DOE Contract Number: AC03-76SF00098
• Assignee: Regents of University of California (Oakland, CA)
• Patent Number(s): US 5434417
• OSTI ID: 869990
• Country of Publication: United States
• Language: English

Related Subjects

resolution
energy-sensitive
digital
x-ray
apparatus
method
detecting
determining
depth
penetration
semiconductor
strip
detector
embodiment
formed
material
disposed
edge-on
orientation
towards
source
x-rays
incident
substantially
perpendicular
front
edge
plurality
segments
coupled
collinear
arrangement
length
interact
forms
electrodes
connected
detect
thereto
signal
processor
detects
interaction
indicates
time
substantially perpendicular
signal processor
x-ray source
semiconductor material
detector detects
strip detector
semiconductor strip
x-rays incident
signal process
digital x-ray
rays incident
strip detect
/250/