High resolution energy-sensitive digital X-ray

Patent · Tue Jul 18 04:00:00 EDT 1995

OSTI ID:87764

Nygren, D R

An apparatus and method for detecting an x-ray and for determining the depth of penetration of an x-ray into a semiconductor strip detector. In one embodiment, a semiconductor strip detector formed of semiconductor material is disposed in an edge-on orientation towards an x-ray source such that x-rays from the x-ray source are incident upon and substantially perpendicular to the front edge of the semiconductor strip detector. The semiconductor strip detector is formed of a plurality of segments. The segments are coupled together in a collinear arrangement such that the semiconductor strip detector has a length great enough such that substantially all of the x-rays incident on the front edge of the semiconductor strip detector interact with the semiconductor material which forms the semiconductor strip detector. A plurality of electrodes are connected to the semiconductor strip detector such that each one of the semiconductor strip detector segments has at least one of the of electrodes coupled thereto. A signal processor is also coupled to each one of the electrodes. The present detector detects an interaction within the semiconductor strip detector, between an x-ray and the semiconductor material, and also indicates the depth of penetration of the x-ray into the semiconductor strip detector at the time of the interaction. 5 figs.

• Research Organization: University of California
• DOE Contract Number: AC03-76SF00098
• Assignee: Univ. of California, Oakland, CA (United States)
• Patent Number(s): US 5,434,417/A/
• Application Number: PAN: 8-148,151
• OSTI ID: 87764
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
DIAGNOSTIC TECHNIQUES
MEASURING METHODS
RADIATION DETECTORS
SEMICONDUCTOR DETECTORS
X RADIATION
X-RAY DETECTION