Crystallization and doping of amorphous silicon on low temperature plastic
Patent
·
OSTI ID:869492
- Pleasanton, CA
- Palo Alto, CA
- Campbell, CA
- Beaverton, OR
A method or process of crystallizing and doping amorphous silicon (a-Si) on a low-temperature plastic substrate using a short pulsed high energy source in a selected environment, without heat propagation and build-up in the substrate. The pulsed energy processing of the a-Si in a selected environment, such as BF3 and PF5, will form a doped micro-crystalline or poly-crystalline silicon (pc-Si) region or junction point with improved mobilities, lifetimes and drift and diffusion lengths and with reduced resistivity. The advantage of this method or process is that it provides for high energy materials processing on low cost, low temperature, transparent plastic substrates. Using pulsed laser processing a high (>900.degree. C.), localized processing temperature can be achieved in thin films, with little accompanying temperature rise in the substrate, since substrate temperatures do not exceed 180.degree. C. for more than a few microseconds. This method enables use of plastics incapable of withstanding sustained processing temperatures (higher than 180.degree. C.) but which are much lower cost, have high tolerance to ultraviolet light, have high strength and good transparency, compared to higher temperature plastics such as polyimide.
- Research Organization:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA
- DOE Contract Number:
- W-7405-ENG-48
- Assignee:
- Regents of University of California (Oakland, CA)
- Patent Number(s):
- US 5346850
- OSTI ID:
- 869492
- Country of Publication:
- United States
- Language:
- English
Epitaxial laser crystallization of thin‐film amorphous silicon
|
journal | August 1978 |
Flexible light-Emitting Diode Developed from Conducting Polymers: ▪ Experimental device that operates even when sharply bent represents significant step in semiconductor technology
|
journal | June 1992 |
Similar Records
Crystallization and doping of amorphous silicon on low temperature plastic
Thin Film Transistors On Plastic Substrates
Process–Structure–Properties Relationships of Passivating, Electron–Selective Contacts Formed by Atmospheric Pressure Chemical Vapor Deposition of Phosphorus–Doped Polysilicon
Patent
·
Tue Sep 13 00:00:00 EDT 1994
·
OSTI ID:6988232
Thin Film Transistors On Plastic Substrates
Patent
·
Mon Jan 19 23:00:00 EST 2004
·
OSTI ID:879500
Process–Structure–Properties Relationships of Passivating, Electron–Selective Contacts Formed by Atmospheric Pressure Chemical Vapor Deposition of Phosphorus–Doped Polysilicon
Journal Article
·
Wed Jan 26 23:00:00 EST 2022
· Physica Status Solidi. Rapid Research Letters
·
OSTI ID:2212850
Related Subjects
/438/
180
900
a-si
accompanying
achieved
advantage
amorphous
amorphous silicon
bf3
build-up
compared
cost
crystalline silicon
crystallization
crystallizing
degree
diffusion
diffusion length
doped
doping
drift
enables
energy
energy processing
energy source
environment
exceed
films
form
heat
improved
incapable
junction
laser
laser processing
lengths
lifetimes
light
localized
low-temperature
low-temperature plastic
materials
method
method enables
micro-crystalline
microseconds
mobilities
pc-si
pf5
plastic
plastic substrate
plastic substrates
plastics
poly-crystalline
polyimide
process
processing
processing temperature
processing temperatures
propagation
provides
pulsed
pulsed energy
pulsed laser
rate temperature
reduced
region
resistivity
rise
selected
silicon
source
strength
substrate
substrate temperature
substrate temperatures
substrates
sustained
temperature
temperature plastic
temperature rise
temperatures
tolerance
transparency
transparent
ultraviolet
ultraviolet light
violet light
withstanding
180
900
a-si
accompanying
achieved
advantage
amorphous
amorphous silicon
bf3
build-up
compared
cost
crystalline silicon
crystallization
crystallizing
degree
diffusion
diffusion length
doped
doping
drift
enables
energy
energy processing
energy source
environment
exceed
films
form
heat
improved
incapable
junction
laser
laser processing
lengths
lifetimes
light
localized
low-temperature
low-temperature plastic
materials
method
method enables
micro-crystalline
microseconds
mobilities
pc-si
pf5
plastic
plastic substrate
plastic substrates
plastics
poly-crystalline
polyimide
process
processing
processing temperature
processing temperatures
propagation
provides
pulsed
pulsed energy
pulsed laser
rate temperature
reduced
region
resistivity
rise
selected
silicon
source
strength
substrate
substrate temperature
substrate temperatures
substrates
sustained
temperature
temperature plastic
temperature rise
temperatures
tolerance
transparency
transparent
ultraviolet
ultraviolet light
violet light
withstanding