Integrated optical tamper sensor with planar waveguide
Patent
·
OSTI ID:868627
- Albuquerque, NM
A monolithic optical tamper sensor, comprising an optical emitter and detector, connected by an optical waveguide and placed into the critical entry plane of an enclosed sensitive region, the tamper sensor having a myriad of scraps of a material optically absorbent at the wavelength of interest, such that when the absorbent material is in place on the waveguide, an unique optical signature can be recorded, but when entry is attempted into the enclosed sensitive region, the scraps of absorbent material will be displaced and the optical/electrical signature of the tamper sensor will change and that change can be recorded.
- Research Organization:
- AT & T CORP
- DOE Contract Number:
- AC04-76DP00789
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Number(s):
- US 5177352
- OSTI ID:
- 868627
- Country of Publication:
- United States
- Language:
- English
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absorbent
attempted
change
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detector
displaced
electrical
emitter
enclosed
entry
integrated
integrated optic
integrated optical
material
monolithic
myriad
optical
optical tamper
optical wave
optical waveguide
optically
placed
planar
plane
recorded
region
scraps
sensitive
sensor
signature
sorbent material
tamper
tamper sensor
unique
waveguide
wavelength
absorbent
attempted
change
comprising
connected
critical
detector
displaced
electrical
emitter
enclosed
entry
integrated
integrated optic
integrated optical
material
monolithic
myriad
optical
optical tamper
optical wave
optical waveguide
optically
placed
planar
plane
recorded
region
scraps
sensitive
sensor
signature
sorbent material
tamper
tamper sensor
unique
waveguide
wavelength