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U.S. Department of Energy
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Integrated optical tamper sensor with planar waveguide

Patent ·
OSTI ID:868627

A monolithic optical tamper sensor, comprising an optical emitter and detector, connected by an optical waveguide and placed into the critical entry plane of an enclosed sensitive region, the tamper sensor having a myriad of scraps of a material optically absorbent at the wavelength of interest, such that when the absorbent material is in place on the waveguide, an unique optical signature can be recorded, but when entry is attempted into the enclosed sensitive region, the scraps of absorbent material will be displaced and the optical/electrical signature of the tamper sensor will change and that change can be recorded.

Research Organization:
AT & T CORP
DOE Contract Number:
AC04-76DP00789
Assignee:
United States of America as represented by United States (Washington, DC)
Patent Number(s):
US 5177352
OSTI ID:
868627
Country of Publication:
United States
Language:
English

References (6)

Vibration Sensor Using Integrated Optical Coupling Element book January 1985
Characteristics of optical guided modes in multilayer metal-clad planar optical guide with low-index dielectric buffer layer journal September 1975
Integrated Optical Detectors book January 1982
Sensor Applications of Low Finesse Integrated Optical Fabry-Perot Resonators book January 1985
A novel deposit/spin waveguide interconnection (DSWI) for semiconductor integrated optics journal October 1982
Semiconductor Components for Monolithic Applications book January 1975