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Title: Apparatus and method for transient thermal infrared emission spectrometry

Abstract

A method and apparatus for enabling analysis of a solid material (16, 42) by applying energy from an energy source (20, 70) top a surface region of the solid material sufficient to cause transient heating in a thin surface layer portion of the solid material (16, 42) so as to enable transient thermal emission of infrared radiation from the thin surface layer portion, and by detecting with a spectrometer/detector (28, 58) substantially only the transient thermal emission of infrared radiation from the thin surface layer portion of the solid material. The detected transient thermal emission of infrared radiation is sufficiently free of self-absorption by the solid material of emitted infrared radiation, so as to be indicative of characteristics relating to molecular composition of the solid material.

Inventors:
 [1];  [1]
  1. (Ames, IA)
Publication Date:
Research Org.:
Ames Laboratory (AMES), Ames, IA; Iowa State University, Ames, IA (US)
OSTI Identifier:
868102
Patent Number(s):
US 5075552
Application Number:
07/576,448
Assignee:
Iowa State University Research Foundation Inc. (Ames, IA) AMES
DOE Contract Number:  
W-7405-ENG-82
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
apparatus; method; transient; thermal; infrared; emission; spectrometry; enabling; analysis; solid; material; 16; 42; applying; energy; source; 20; 70; top; surface; region; sufficient; heating; layer; portion; enable; radiation; detecting; spectrometer; detector; 28; 58; substantially; detected; sufficiently; free; self-absorption; emitted; indicative; characteristics; relating; molecular; composition; transient thermal; layer portion; sufficiently free; thermal infrared; surface region; infrared emission; energy source; infrared radiation; solid material; surface layer; molecular composition; characteristics relating; emitted infrared; material sufficient; enabling analysis; applying energy; /250/

Citation Formats

McClelland, John F., and Jones, Roger W. Apparatus and method for transient thermal infrared emission spectrometry. United States: N. p., 1991. Web.
McClelland, John F., & Jones, Roger W. Apparatus and method for transient thermal infrared emission spectrometry. United States.
McClelland, John F., and Jones, Roger W. Tue . "Apparatus and method for transient thermal infrared emission spectrometry". United States. https://www.osti.gov/servlets/purl/868102.
@article{osti_868102,
title = {Apparatus and method for transient thermal infrared emission spectrometry},
author = {McClelland, John F. and Jones, Roger W.},
abstractNote = {A method and apparatus for enabling analysis of a solid material (16, 42) by applying energy from an energy source (20, 70) top a surface region of the solid material sufficient to cause transient heating in a thin surface layer portion of the solid material (16, 42) so as to enable transient thermal emission of infrared radiation from the thin surface layer portion, and by detecting with a spectrometer/detector (28, 58) substantially only the transient thermal emission of infrared radiation from the thin surface layer portion of the solid material. The detected transient thermal emission of infrared radiation is sufficiently free of self-absorption by the solid material of emitted infrared radiation, so as to be indicative of characteristics relating to molecular composition of the solid material.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Dec 24 00:00:00 EST 1991},
month = {Tue Dec 24 00:00:00 EST 1991}
}

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