Apparatus and method for transient thermal infrared spectrometry

Patent · Mon Dec 02 23:00:00 EST 1991

OSTI ID:5524288

McClelland, J F; Jones, R W

This patent describes a method for enabling analysis of a material. It comprises cooling a thin surface layer portion of the material to transiently generate a temperature differential between the thin surface layer portion and a lower portion of the material sufficient to alter the thermal infrared emission spectrum of the material from the black-body thermal infrared emission spectrum of the material; and detecting the altered thermal infrared emission spectrum of the material while the altered thermal infrared emission spectrum is sufficiently free of self-absorption by the material of emitted infrared radiation, prior to the temperature differential propagating into the lower portion of the material to an extent such that the altered thermal infrared emission spectrum is no longer sufficiently free of self-absorption by the material of emitted infrared radiation, so that the detected altered thermal infrared emission spectrum is indicative of characteristics relating to molecular composition of the material.

• Assignee: Iowa State Univ. Research Foundation, Inc., Ames, Iowa (United States)
• Patent Number(s): A; US 5070242
• Application Number: PPN: US 7-546738
• OSTI ID: 5524288
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400102* -- Chemical & Spectral Procedures
440800 -- Miscellaneous Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
DESIGN
ELECTROMAGNETIC RADIATION
INFRARED RADIATION
INFRARED SPECTROMETERS
INFRARED THERMOGRAPHY
MATERIALS
MATERIALS TESTING
MEASURING INSTRUMENTS
MEASURING METHODS
MOLECULAR STRUCTURE
RADIATIONS
SPECTROMETERS
TESTING
THERMOGRAPHY