Apparatus for monitoring X-ray beam alignment

Patent · Tue Oct 08 00:00:00 EDT 1991

OSTI ID:868022

Steinmeyer, Peter A ^[1]

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1. Arvada, CO

A self-contained, hand-held apparatus is provided for minitoring alignment of an X-ray beam in an instrument employing an X-ray source. The apparatus includes a transducer assembly containing a photoresistor for providing a range of electrical signals responsive to a range of X-ray beam intensities from the X-ray beam being aligned. A circuit, powered by a 7.5 VDC power supply and containing an audio frequency pulse generator whose frequency varies with the resistance of the photoresistor, is provided for generating a range of audible sounds. A portion of the audible range corresponds to low X-ray beam intensity. Another portion of the audible range corresponds to high X-ray beam intensity. The transducer assembly may include an a photoresistor, a thin layer of X-ray fluorescent material, and a filter layer transparent to X-rays but opaque to visible light. X-rays from the beam undergoing alignment penetrate the filter layer and excite the layer of fluorescent material. The light emitted from the fluorescent material alters the resistance of the photoresistor which is in the electrical circuit including the audio pulse generator and a speaker. In employing the apparatus, the X-ray beam is aligned to a complete alignment by adjusting the X-ray beam to produce an audible sound of the maximum frequency.

• Research Organization: ROCKWELL INTERNATIONAL CORP
• DOE Contract Number: AC04-76DP03533
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 5056129
• Application Number: 07/406,003
• OSTI ID: 868022
• Country of Publication: United States
• Language: English

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