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Title: Diffraction encoded position measuring apparatus

Abstract

When a lightwave passes through a transmission grating, diffracted beams appear at the output or opposite side of the grating that are effectively Doppler shifted in frequency (phase) whereby a detector system can compare the phase of the zero order and higher order beams to obtain an indication of position. Multiple passes through the grating increase resolution for a given wavelength of a laser signal. The resolution can be improved further by using a smaller wavelength laser to generate the grating itself. Since the grating must only have a pitch sufficient to produce diffracted orders, inexpensive, ultraviolet wavelength lasers can be utilized and still obtain high resolution detection.

Inventors:
 [1]
  1. (Thousand Oaks, CA)
Publication Date:
Research Org.:
Rockwell International Corp
OSTI Identifier:
867996
Patent Number(s):
US 5050993
Assignee:
Rockwell International Corporation (El Segundo, CA) OAK
DOE Contract Number:  
AC03-86SF16499
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
diffraction; encoded; position; measuring; apparatus; lightwave; passes; transmission; grating; diffracted; beams; appear; output; opposite; effectively; doppler; shifted; frequency; phase; whereby; detector; compare; zero; obtain; indication; multiple; increase; resolution; wavelength; laser; signal; improved; generate; pitch; sufficient; produce; inexpensive; ultraviolet; lasers; utilized; detection; wavelength laser; multiple passes; ultraviolet wavelength; multiple pass; measuring apparatus; doppler shift; diffracted beam; transmission grating; wavelength lasers; diffracted beams; laser signal; /356/250/

Citation Formats

Tansey, Richard J. Diffraction encoded position measuring apparatus. United States: N. p., 1991. Web.
Tansey, Richard J. Diffraction encoded position measuring apparatus. United States.
Tansey, Richard J. Tue . "Diffraction encoded position measuring apparatus". United States. https://www.osti.gov/servlets/purl/867996.
@article{osti_867996,
title = {Diffraction encoded position measuring apparatus},
author = {Tansey, Richard J.},
abstractNote = {When a lightwave passes through a transmission grating, diffracted beams appear at the output or opposite side of the grating that are effectively Doppler shifted in frequency (phase) whereby a detector system can compare the phase of the zero order and higher order beams to obtain an indication of position. Multiple passes through the grating increase resolution for a given wavelength of a laser signal. The resolution can be improved further by using a smaller wavelength laser to generate the grating itself. Since the grating must only have a pitch sufficient to produce diffracted orders, inexpensive, ultraviolet wavelength lasers can be utilized and still obtain high resolution detection.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jan 01 00:00:00 EST 1991},
month = {Tue Jan 01 00:00:00 EST 1991}
}

Patent:

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