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Title: Diffraction encoded position measuring apparatus

Abstract

When a lightwave passes through a transmission grating, diffracted beams appear at the output or opposite side of the grating that are effectively Doppler shifted in frequency (phase) whereby a detector system can compare the phase of the zero order and higher order beams to obtain an indication of position. Multiple passes through the grating increase resolution for a given wavelength of a laser signal. The resolution can be improved further by using a smaller wavelength laser to generate the grating itself. Since the grating must only have a pitch sufficient to produce diffracted orders, inexpensive, ultraviolet wavelength lasers can be utilized and still obtain high resolution detection. 3 figures.

Inventors:
Publication Date:
Research Org.:
Rockwell International Corp
OSTI Identifier:
7083291
Patent Number(s):
US 5050993; A
Application Number:
PPN: US 7-365990
Assignee:
Rockwell International Corporation, El Segundo, CA (United States) OAK; EDB-94-111669
DOE Contract Number:  
AC03-86SF16499
Resource Type:
Patent
Resource Relation:
Patent File Date: 14 Jun 1989
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; DISPLACEMENT GAGES; DESIGN; DIFFRACTION GRATINGS; DOPPLER EFFECT; LASER RADIATION; ULTRAVIOLET RADIATION; ELECTROMAGNETIC RADIATION; GRATINGS; MEASURING INSTRUMENTS; RADIATIONS; 440800* - Miscellaneous Instrumentation- (1990-)

Citation Formats

Tansey, R.J. Diffraction encoded position measuring apparatus. United States: N. p., 1991. Web.
Tansey, R.J. Diffraction encoded position measuring apparatus. United States.
Tansey, R.J. Tue . "Diffraction encoded position measuring apparatus". United States.
@article{osti_7083291,
title = {Diffraction encoded position measuring apparatus},
author = {Tansey, R.J.},
abstractNote = {When a lightwave passes through a transmission grating, diffracted beams appear at the output or opposite side of the grating that are effectively Doppler shifted in frequency (phase) whereby a detector system can compare the phase of the zero order and higher order beams to obtain an indication of position. Multiple passes through the grating increase resolution for a given wavelength of a laser signal. The resolution can be improved further by using a smaller wavelength laser to generate the grating itself. Since the grating must only have a pitch sufficient to produce diffracted orders, inexpensive, ultraviolet wavelength lasers can be utilized and still obtain high resolution detection. 3 figures.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Sep 24 00:00:00 EDT 1991},
month = {Tue Sep 24 00:00:00 EDT 1991}
}