Aplanatic and quasi-aplanatic diffraction gratings

Patent · Sun Jan 01 04:00:00 EST 1989

OSTI ID:866817

Hettrick, Michael C ^[1]

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1. Berkeley, CA

A reflection diffraction grating having a series of transverse minute grooves of progressively varying spacing along a concave surface enables use of such gratings for X-ray or longer wavelength imaging of objects. The variable groove spacing establishes aplanatism or substantially uniform magnification across the optical aperture. The grating may be used, for example, in X-ray microscopes or telescopes of the imaging type and in X-ray microprobes. Increased spatial resolution and field of view may be realized in X-ray imaging.

• Research Organization: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA
• DOE Contract Number: AC03-76SF00098
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 4798446
• OSTI ID: 866817
• Country of Publication: United States
• Language: English

Related Subjects

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aperture
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aplanatism
concave
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diffraction
diffraction grating
diffraction gratings
enables
establishes
example
field
grating
gratings
groove
groove spacing
grooves
imaging
increased
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microprobes
microscopes
minute
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progressively
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reflection
reflection diffraction
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series
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spatial
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substantially
substantially uniform
surface
telescopes
transverse
type
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varying
view
wavelength
x-ray
x-ray imaging
x-ray microscope