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Aplanatic and quasi-aplanatic diffraction gratings

Patent ·
OSTI ID:6771068
A reflection diffraction grating having a series of transverse minute grooves of progressively varying spacing along a concave surface enables use of such gratings for x-ray or longer wavelength imaging of objects. The variable groove spacing establishes aplanatism or substantially uniform magnetification across the optical aperture. The grating may be sued, for example, in x-ray microscopes or telescopes of the imaging type and in x-ray microprobed. Increased spatial resolution and field of view may be realized in x-ray imaging. 5 figs.
Research Organization:
Lawrence Berkeley Lab., CA (USA)
DOE Contract Number:
AC03-76SF00098
Assignee:
LBNL; EDB-88-179309
Patent Number(s):
PATENTS-US-A6095715
OSTI ID:
6771068
Country of Publication:
United States
Language:
English

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