Aplanatic and quasi-aplanatic diffraction gratings

Patent · 14 September 1987

OSTI ID:6771068

Hettrick, M C

A reflection diffraction grating having a series of transverse minute grooves of progressively varying spacing along a concave surface enables use of such gratings for x-ray or longer wavelength imaging of objects. The variable groove spacing establishes aplanatism or substantially uniform magnetification across the optical aperture. The grating may be sued, for example, in x-ray microscopes or telescopes of the imaging type and in x-ray microprobed. Increased spatial resolution and field of view may be realized in x-ray imaging. 5 figs.

• Research Organization: Lawrence Berkeley Lab., CA (USA)
• DOE Contract Number: AC03-76SF00098
• Assignee: LBNL; EDB-88-179309
• Patent Number(s): PATENTS-US-A6095715
• OSTI ID: 6771068
• Country of Publication: United States
• Language: English

Related Subjects

440300* -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
COHERENT SCATTERING
DESIGN
DIFFRACTION
EQUATIONS
GRATINGS
RESOLUTION
SCATTERING
SPATIAL RESOLUTION
X-RAY DIFFRACTION