Interferometric apparatus and method for detection and characterization of particles using light scattered therefrom

Patent · Thu Dec 31 23:00:00 EST 1987

OSTI ID:866679

Johnston, Roger G ^[1]

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1. Los Alamos, NM

Interferometric apparatus and method for detection and characterization of particles using light scattered therefrom. Differential phase measurements on scattered light from particles are possible using the two-frequency Zeeman effect laser which emits two frequencies of radiation 250 kHz apart. Excellent discrimination and reproducibility for various pure pollen and bacterial samples in suspension have been observed with a single polarization element. Additionally, a 250 kHz beat frequency was recorded from an individual particle traversing the focused output from the laser in a flow cytometer.

• Research Organization: Los Alamos National Laboratory (LANL), Los Alamos, NM
• DOE Contract Number: W-7405-ENG-36
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 4764013
• OSTI ID: 866679
• Country of Publication: United States
• Language: English

Related Subjects

/356/
250
additionally
apart
apparatus
bacterial
beat
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characterization
cytometer
detection
differential
differential phase
discrimination
effect
element
emits
excellent
flow
flow cytometer
focused
frequencies
frequency
individual
individual particle
interferometric
interferometric apparatus
khz
laser
light
light scattered
measurements
method
observed
output
particle
particles
phase
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polarization
pollen
pure
radiation
recorded
reproducibility
samples
scattered
scattered light
scattered therefrom
single
suspension
therefrom
traversing
two-frequency
various
zeeman