Apparatus and method for detection and characterization of particles using light scattered therefrom
Patent
·
OSTI ID:7092905
Apparatus and method for detection and characterization of particles using light scattered therefrom. Differential phase measurements on scattered light from particles are possible using the two-frequency Zeeman effect laser which emits two frequencies of radiation 250 kHz apart. Excellent discrimination and reproducibility for various pure pollen and bacterial samples in suspension have been observed with a single polarization element. Additionally, a 250 kHz beat frequency was recorded from an individual particle traversing the focused output from the laser in a flow cytometer. 13 figs.
- Research Organization:
- Los Alamos National Lab., NM (USA)
- DOE Contract Number:
- W-7405-ENG-36
- Assignee:
- TIC; ERA-14-001884; EDB-88-187398
- Patent Number(s):
- PATENTS-US-A6028987
- OSTI ID:
- 7092905
- Country of Publication:
- United States
- Language:
- English
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