High resolution collimator system for X-ray detector
Patent
·
OSTI ID:866117
- Schenectady, NY
- Scotia, NY
High resolution in an X-ray computerized tomography (CT) inspection system is achieved by using a collimator/detector combination to limit the beam width of the X-ray beam incident on a detector element to the desired resolution width. In a detector such as a high pressure Xenon detector array, a narrow tapered collimator is provided above a wide detector element. The collimator slits have any desired width, as small as a few mils at the top, the slit width is easily controlled, and they are fabricated on standard machines. The slit length determines the slice thickness of the CT image.
- Assignee:
- General Electric Company (Schenectady, NY)
- Patent Number(s):
- US 4638499
- OSTI ID:
- 866117
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
/378/250/976/
achieved
array
beam
beam incident
collimator
combination
computerized
computerized tomography
controlled
desired
detector
detector array
detector combination
detector element
determines
easily
easily controlled
element
fabricated
image
incident
inspection
length
limit
machines
mils
narrow
narrow tapered
pressure
pressure xenon
provided
ray detector
resolution
slice
slit
slit width
slits
standard
tapered
thickness
tomography
top
wide
width
x-ray
x-ray beam
x-ray detector
xenon
achieved
array
beam
beam incident
collimator
combination
computerized
computerized tomography
controlled
desired
detector
detector array
detector combination
detector element
determines
easily
easily controlled
element
fabricated
image
incident
inspection
length
limit
machines
mils
narrow
narrow tapered
pressure
pressure xenon
provided
ray detector
resolution
slice
slit
slit width
slits
standard
tapered
thickness
tomography
top
wide
width
x-ray
x-ray beam
x-ray detector
xenon