Horizontal film balance having wide range and high sensitivity

Patent · Sat Jan 01 04:00:00 EST 1983

OSTI ID:864765

Abraham, Bernard M ^[1]; Miyano, Kenjiro ^[2]; Ketterson, John B ^[3]

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1. Oak Park, IL
2. Downers Grove, IL
3. Evanston, IL

A thin-film, horizontal balance instrument is provided for measuring surface tension (surface energy) of thin films suspended on a liquid substrate. The balance includes a support bearing and an optical feedback arrangement for wide-range, high sensitivity measurements. The force on the instrument is balanced by an electromagnet, the current through the magnet providing a measure of the force applied to the instrument. A novel float construction is also disclosed.

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL
• DOE Contract Number: W-31109-ENG-38
• Assignee: Abraham, Bernard M. (Oak Park, IL);Miyano, Kenjiro (Downers Grove, IL);Ketterson, John B. (Evanston, IL)
• Patent Number(s): US 4413506
• OSTI ID: 864765
• Country of Publication: United States
• Language: English

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