Horizontal film balance having wide range and high sensitivity

Patent · Sat Jan 01 00:00:00 EST 1983

OSTI ID:864765

Abraham, Bernard M ^[1]; Miyano, Kenjiro ^[2]; Ketterson, John B ^[3]

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1. Oak Park, IL
2. Downers Grove, IL
3. Evanston, IL

A thin-film, horizontal balance instrument is provided for measuring surface tension (surface energy) of thin films suspended on a liquid substrate. The balance includes a support bearing and an optical feedback arrangement for wide-range, high sensitivity measurements. The force on the instrument is balanced by an electromagnet, the current through the magnet providing a measure of the force applied to the instrument. A novel float construction is also disclosed.

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL (United States)
• DOE Contract Number: W-31109-ENG-38
• Assignee: Abraham, Bernard M. (Oak Park, IL);Miyano, Kenjiro (Downers Grove, IL);Ketterson, John B. (Evanston, IL)
• Patent Number(s): US 4413506
• OSTI ID: 864765
• Country of Publication: United States
• Language: English

Related Subjects

horizontal
film
balance
wide
range
sensitivity
thin-film
instrument
provided
measuring
surface
tension
energy
films
suspended
liquid
substrate
support
bearing
optical
feedback
arrangement
wide-range
measurements
force
balanced
electromagnet
current
magnet
providing
measure
applied
novel
float
construction
disclosed
surface energy
force applied
wide range
surface tension
measuring surface
optical feedback
feedback arrangement
support bearing
liquid substrate
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