Magnetic Modulator Lifetime Tests Using the Sandia Reliability Test-Bed

Conference · Wed Jun 23 00:00:00 EDT 1999

OSTI ID:8460

Kiekel, Paul D ^[1]; Martinez, Leonard E; Pena, Gary E; Reed, Kim W; Schneider, Larry X

---

1. Sandia National Laboratories

Experimental results are presented that provide design guidelines for high repetition rate, long-life pulsed power magnetic modulators. Fault mechanisms that occurred during a series of 32 million shots at 100 pps, with continuous runs of up to 5.7 million shots (~16 hours) on the Dos Lineas magnetic modulator are described. An effort to explain the fault mechanisms and how to avoid them is made. Factors that limit the long life performance of a variety of components including switches, cables and oil are encountered. The high reliability of the magnetic switch technology is demonstrated.

• Research Organization: Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA
• Sponsoring Organization: USDOE
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 8460
• Report Number(s): SAND99-1571C; ON: DE00008460
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
High-Voltage Pulse Generators
Magnetic Circuits
Modulation
Service Life
Testing