Laser-induced damage in dielectrics with nanosecond to subpicosecond pulses. II. Theory
Conference
·
OSTI ID:83792
- and others
The authors have reported extensive measurements of damage thresholds for fused silica and several fluorides (LiF, CaF, MgF, and BaF) at 1053 and 526 nm for pulse durations, {tau}, ranging from 275 fs to 1 ns. A theoretical model based on electron production via multiphoton ionization, Joule heating, and collisional (avalanche) ionization is in good agreement with experimental results.
- Research Organization:
- Lawrence Livermore National Lab., CA (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 83792
- Report Number(s):
- UCRL-JC--118156-Pt.2; CONF-9410155--6-Pt.2; ON: DE95014536
- Country of Publication:
- United States
- Language:
- English
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