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Title: Scanning X-ray microdiffraction with submicrometer white beam for strain / stress and orientation mapping in thin films

Journal Article · · Journal of Synchrotron Radiation

No abstract prepared.

Research Organization:
SLAC National Accelerator Lab., Menlo Park, CA (United States); Stanford Synchrotron Radiation Laboratory (US)
Sponsoring Organization:
USDOE Office of Science (US)
DOE Contract Number:
AC03-76SF00515
OSTI ID:
831024
Report Number(s):
SLAC-REPRINT-2003-014; TRN: US0404625
Journal Information:
Journal of Synchrotron Radiation, Vol. 10; Other Information: PBD: 1 Mar 2003
Country of Publication:
United States
Language:
English

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