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Electrical Conductance of Reconstructed Silicon Surfaces

Journal Article · Tue Jan 01 04:00:00 EST 2002 · Physical Review, B: Condensed Matter

DOI:https://doi.org/10.1103/PhysRevB.65.115424· OSTI ID:829262

Yoo, K ^[1]

ORNL

No abstract prepared.

Print

Research Organization:: ORNL Oak Ridge National Laboratory

Sponsoring Organization:: DOE

DOE Contract Number:: AC05-00OR22725

OSTI ID:: 829262

Report Number(s):: P01-112129

Journal Information:: Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Vol. 65; ISSN PRBMDO; ISSN 0163-1829

Country of Publication:: United States

Language:: English

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Related Subjects

36 MATERIALS SCIENCE
ELECTRIC CONDUCTIVITY
SILICON
SURFACE PROPERTIES