Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Chaos in Electronic Circuits: Nonlinear Time Series Analysis

Thesis/Dissertation ·
DOI:https://doi.org/10.2172/821547· OSTI ID:821547
 [1]
  1. Kennedy Western Univ., Cheyenne, WY (United States); LANL< Group IM-1

Chaos in electronic circuits is a phenomenon that has been largely ignored by engineers, manufacturers, and researchers until the early 1990’s and the work of Chua, Matsumoto, and others. As the world becomes more dependent on electronic devices, the detrimental effects of non-normal operation of these devices becomes more significant. Developing a better understanding of the mechanisms involved in the chaotic behavior of electronic circuits is a logical step toward the prediction and prevention of any potentially catastrophic occurrence of this phenomenon. Also, a better understanding of chaotic behavior, in a general sense, could potentially lead to better accuracy in the prediction of natural events such as weather, volcanic activity, and earthquakes. As a first step in this improvement of understanding, and as part of the research being reported here, methods of computer modeling, identifying and analyzing, and producing chaotic behavior in simple electronic circuits have been developed. The computer models were developed using both the Alternative Transient Program (ATP) and Spice, the analysis techniques have been implemented using the C and C++ programming languages, and the chaotically behaving circuits developed using “off the shelf” electronic components.

Research Organization:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Organization:
USDOE
OSTI ID:
821547
Report Number(s):
LA--14059-T
Country of Publication:
United States
Language:
English

Similar Records

The Induction of Chaos in Electronic Circuits Final Report-October 1, 2001
Technical Report · Mon Mar 31 23:00:00 EST 2003 · OSTI ID:812178

Chaos in Josephson circuits
Journal Article · Sun May 01 00:00:00 EDT 1983 · IEEE Trans. Magn.; (United States) · OSTI ID:5595447

Exploiting chaos for applications
Journal Article · Tue Sep 15 00:00:00 EDT 2015 · Chaos (Woodbury, N. Y.) · OSTI ID:22483220