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Chaos in Josephson circuits

Journal Article · · IEEE Trans. Magn.; (United States)

Chaotic behavior in Josephson circuits is reviewed using the rf-driven junction as an example. Topics include the effect of chaos on the I-V characteristic, the period doubling route to chaos, and power spectra for the chaotic state. Liapunov exponents and the fractal geometry of strange attractors are also discussed.

Research Organization:
Nat'l Bureau of Standards, Electromagnetic Technology Div., Cryoelectronic Metrology Group, Boulder, CO 80303
OSTI ID:
5595447
Journal Information:
IEEE Trans. Magn.; (United States), Journal Name: IEEE Trans. Magn.; (United States) Vol. 19:3; ISSN IEMGA
Country of Publication:
United States
Language:
English