Chaos in Josephson circuits
Journal Article
·
· IEEE Trans. Magn.; (United States)
Chaotic behavior in Josephson circuits is reviewed using the rf-driven junction as an example. Topics include the effect of chaos on the I-V characteristic, the period doubling route to chaos, and power spectra for the chaotic state. Liapunov exponents and the fractal geometry of strange attractors are also discussed.
- Research Organization:
- Nat'l Bureau of Standards, Electromagnetic Technology Div., Cryoelectronic Metrology Group, Boulder, CO 80303
- OSTI ID:
- 5595447
- Journal Information:
- IEEE Trans. Magn.; (United States), Journal Name: IEEE Trans. Magn.; (United States) Vol. 19:3; ISSN IEMGA
- Country of Publication:
- United States
- Language:
- English
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