Local plasticity of Al thin films as revealed by X-ray microdiffraction
Journal Article
·
· Physical Review Letters
- LBNL Library
Grain-to-grain interactions dominate the plasticity of Al thin films and establish effective length scales smaller than the grain size. We have measured large strain distributions and their changes under plastic strain in 1:5-um-thick Al 0.5 percent Cu films using a 0:8-um-diameter white x-ray probe at the Advanced Light Source. Strain distributions arise not only from the distribution of grain sizes and orientation, but also from the differences in grain shape and from stress environment. Multiple active glide plane domains have been found within single grains. Large grains behave like multiple smaller grains even before a dislocation substructure can evolve.
- Research Organization:
- Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (US)
- Sponsoring Organization:
- Office of Science. Basic Energy Sciences (US)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 810873
- Report Number(s):
- LBNL--52332
- Journal Information:
- Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 9 Vol. 90; ISSN 0031-9007; ISSN PRLTAO
- Country of Publication:
- United States
- Language:
- English
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