Combined near edge x-ray absorption fine structure and x-ray photoemission spectroscopies for the study of amorphous carbon thin films

Journal Article · Tue Jun 15 00:00:00 EDT 1999 · Journal of Electron Spectroscopy and Related Phenomena

DOI:https://doi.org/10.1016/S0368-2048(98)00348-X· OSTI ID:800317

Diaz, J ^[1]; Anders, S; Zhou, X; Moler, E J; Kellar, S A; Hussain, Z

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1. LBNL Library

No abstract prepared.

• Research Organization: Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (US)
• Sponsoring Organization: US Department of Energy (US)
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 800317
• Report Number(s): LBNL/ALS--29500
• Journal Information: Journal of Electron Spectroscopy and Related Phenomena, Journal Name: Journal of Electron Spectroscopy and Related Phenomena Vol. 101-103; ISSN JESRAW; ISSN 0368-2048
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ABSORPTION
ADVANCED LIGHT SOURCE
ADVANCED LIGHT SOURCE ALS
CARBON
FINE STRUCTURE
PHOTOEMISSION
THIN FILMS