X-ray diffraction stress mapping: Application to thin film buckling analysis
Conference
·
OSTI ID:797238
- LBNL Library
No abstract prepared.
- Research Organization:
- Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, CA (US)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 797238
- Report Number(s):
- LBNL/ALS--43372
- Country of Publication:
- United States
- Language:
- English
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