Study of buried interfaces by soft x-ray fluorescence spectroscopy excited by synchrotron radiation

Journal Article · Wed May 01 00:00:00 EDT 1996 · Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films

DOI:https://doi.org/10.1116/1.580404· OSTI ID:794733

Ederer, David L ^[1]; Carlisle, John A; Jimenez Guerrero, Ignacio; Jia, Jianjun; Osborn, Kevin D; Callcott, Thomas A; Perera, Rupert C.C.; Underwood, James H; Terminello, Louis J; Asfaw, Araya; Himpsel, Franz J

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1. LBNL Library

No abstract prepared.

• Research Organization: Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (US)
• Sponsoring Organization: US Department of Energy (US)
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 794733
• Report Number(s): LBNL/ALS--549
• Journal Information: Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films, Journal Name: Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films Vol. 14
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
ADVANCED LIGHT SOURCE
ADVANCED LIGHT SOURCE ALS
FLUORESCENCE SPECTROSCOPY
SYNCHROTRON RADIATION