X-ray emission study of ion beam mixed Cu/Al films on polyimide
Journal Article
·
· Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films
- LBNL Library
No abstract prepared.
- Research Organization:
- Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (US)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 794526
- Report Number(s):
- LBNL/ALS--1110
- Journal Information:
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films, Journal Name: Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films Journal Issue: 2 Vol. 17
- Country of Publication:
- United States
- Language:
- English
Similar Records
X-ray emission study of ion beam mixed Cu/Al films on polyimide
Mechanism for interfacial adhesion strength of an ion beam mixed Cu/polyimide with a thin buffer layer
Soft x-ray fluorescence measurements of polyimide films
Journal Article
·
Sun Feb 28 23:00:00 EST 1999
· Journal of Vacuum Science and Technology, A
·
OSTI ID:321487
Mechanism for interfacial adhesion strength of an ion beam mixed Cu/polyimide with a thin buffer layer
Journal Article
·
Thu Dec 31 23:00:00 EST 1998
· Applied Physics Letters
·
OSTI ID:794577
Soft x-ray fluorescence measurements of polyimide films
Journal Article
·
Tue Dec 14 23:00:00 EST 1999
· Thin Solid Films
·
OSTI ID:794529