10 (micro)m and 5 (micro)m Pinhole-Assisted Point-Projection Backlit Imaging for NIF
Pinhole-assisted point-projection backlighting with 10{micro}m and 5 {micro}m pinholes placed a small distance of order 1 mm away from the backlighter produces images with large field of view and high resolution. Pinholes placed closely to high-power backlighter sources can vaporize and close due to x-ray driven ablation, thereby limiting the usefulness of this method. A study of streaked 1-D backlit imaging of 25 {micro}m W wires using the OMEGA laser is presented. The pinhole closure timescale for 10 {micro}m pinholes placed 0.45 mm and 1 mm distant from the backlighter is 1.3 ns and 2.2 ns, respectively. Similar timescales for 5 {micro}m pinholes is also presented. Successful wire imaging prior to pinhole closure is clearly demonstrated.
- Research Organization:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Organization:
- USDOE Office of Defense Programs (DP) (US)
- DOE Contract Number:
- W-7405-Eng-48
- OSTI ID:
- 792367
- Report Number(s):
- UCRL-JC-137904; TRN: US0205635
- Resource Relation:
- Conference: 13th Topical Conference on High-Temperature Plasma Diagnostics, Tucson, AZ (US), 06/18/2000--06/22/2000; Other Information: PBD: 5 Jun 2001
- Country of Publication:
- United States
- Language:
- English
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