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Title: 10 and 5 {mu}m pinhole-assisted point-projection backlit imaging for the National Ignition Facility

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1318253· OSTI ID:40204797

In pinhole-assisted point-projection backlighting, pinholes are placed a small distance (of order 1 mm) away from the backlighter source to produce images with large field of view. Pinholes placed close to high-power backlighter sources can vaporize and, if sufficiently small, close due to x-ray driven ablation, thereby potentially limiting the usefulness of this method. A study of streaked one-dimensional backlit imaging of 25 {mu}m W wires using the OMEGA laser at the University of Rochester is presented. The pinhole closure time scale for 10 {mu}m pinholes placed 0.45 and 1 mm distant from a 0.6 TW Ti backlighter is 1.3 and 2.2 ns, respectively. Similar time scales for 5 {mu}m pinholes is also presented. Successful wire imaging prior to pinhole closure is clearly demonstrated.

Sponsoring Organization:
(US)
OSTI ID:
40204797
Journal Information:
Review of Scientific Instruments, Vol. 72, Issue 1; Other Information: Othernumber: RSINAK000072000001000690000001; 574101CON; PBD: Jan 2001; ISSN 0034-6748
Publisher:
The American Physical Society
Country of Publication:
United States
Language:
English

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