Surface-Sensitive, Element-Specific Magnetometry with X-Ray Linear Dichroism
- LLNL
Here it is shown that the magnetic linear dichroism in x-ray photoemission (XMLD) signal can be used to measure the element specific magnetic moments in ultra thin alloy films. Comparison with recent SQUID data provides a quantitative check that demonstrates that the total magnetization derived from summing the constituent elemental moments is correct.
- Research Organization:
- Lawrence Livermore National Lab., CA (US)
- Sponsoring Organization:
- USDOE Office of Defense Programs (DP) (US)
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 791447
- Report Number(s):
- UCRL-JC-135969
- Country of Publication:
- United States
- Language:
- English
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