Surface-sensitive, element-specific magnetometry with x-ray linear dichroism
Journal Article
·
· Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films
- The Pennsylvania State University, Department of Physics, University Park, Pennsylvania 16802 (United States)
- Department of Chemistry and Material Science, Lawrence Livermore National Laboratory, Livermore, California 94550 (United States)
It is shown that the x-ray magnetic linear dichroism (XMLD) in x-ray photoemission signal can be used to monitor the element specific magnetic moments in ultra thin alloy films. Comparison with recent superconducting quantum interference device data provides a quantitative check that demonstrates that the total magnetization derived from summing the constituent elemental moments changes with the composition of the alloy. This is illustrated by the contrasting behavior of FeNi and CoNi alloys. (c) 2000 American Vacuum Society.
- OSTI ID:
- 20217049
- Journal Information:
- Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films, Journal Name: Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films Journal Issue: 4 Vol. 18; ISSN 0734-2101; ISSN JVTAD6
- Country of Publication:
- United States
- Language:
- English
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