Synchrotron radiation excited total reflection x-ray fluorescence quantitative analysis of Si wafer by absolute fluorescence intensity calculation
Journal Article
·
· Materials Letters
- LBNL Library
No abstract prepared.
- Research Organization:
- Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (US)
- Sponsoring Organization:
- USDOE Director, Office of Science. Office of Basic Energy Studies. Division of Materials Sciences (US)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 787011
- Report Number(s):
- LBNL--48602
- Journal Information:
- Materials Letters, Journal Name: Materials Letters Journal Issue: 1 Vol. 49; ISSN MLETDJ; ISSN 0167-577X
- Country of Publication:
- United States
- Language:
- English
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