Electron Beam Diagnostics for Jefferson Lab's High Power Free-Electron Laser

Conference · Thu May 01 00:00:00 EDT 1997

DOI:https://doi.org/10.1109/PAC.1997.749879· OSTI ID:776934

Krafft, G A; Jordan, K; Kehne, D; Benson, S; Denard, J; Feldl, E; Piot, P; Song, J; Ursic, R

In this paper the current plans for the diagnostic complement for Jefferson Lab's IRFEL are presented. Diagnostic devices include optical transition radiation beam viewers, both stripline and button beam position monitors, multislit beam emittance measuring devices, coherent synchrotron and transition radiation bunch length monitoring devices, and synchrotron light cameras for measuring the beam profile at high average power. Most devices have update rates of order 1 sec or shorter, and all are controlled through an EPICS control system.

• Research Organization: Thomas Jefferson National Accelerator Facility, Newport News, VA (US)
• Sponsoring Organization: USDOE Office of Energy Research (ER) (US)
• DOE Contract Number: AC05-84ER40150
• OSTI ID: 776934
• Report Number(s): JLAB-ACC-97-43; DOE/ER/40150-1822
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
BEAM EMITTANCE
BEAM MONITORS
BEAM POSITION
BEAM PROFILES
CAMERAS
CEBAF ACCELERATOR
CONTROL SYSTEMS
DIAGNOSTIC TECHNIQUES
ELECTRON BEAMS
FREE ELECTRON LASERS
MONITORING
SYNCHROTRONS
TRANSITION RADIATION