Studies of the magnetic structure at the ferromagnet - antiferromagnet interface
Antiferromagnetic layers are a scientifically challenging component in magneto-electronic devices such as magnetic sensors in hard disk heads, or magnetic RAM elements. In this paper we show that photo-electron emission microscopy (PEEM) is capable of determining the magnetic structure at the interface of ferromagnets and antiferromagnets with high spatial resolution (down to 20 nm). Dichroism effects at the L edges of the magnetic 3d transition metals, using circularly or linearly polarized soft x-rays from a synchrotron source, give rise to a magnetic image contrast. Images, acquired with the PEEM2 experiment at the Advanced Light Source, show magnetic contrast for antiferromagnetic LaFeO{sub 3}, microscopically resolving the magnetic domain structure in an antiferromagnetically ordered thin film for the first time. Magnetic coupling between LaFeO{sub 3} and an adjacent Co layer results in a complete correlation of their magnetic domain structures. From field dependent measurements a unidirectional anisotropy resulting in a local exchange bias of up to 30 Oe in single domains could be deduced. The elemental specificity and the quantitative magnetic sensitivity render PEEM a perfect tool to study magnetic coupling effects in multi-layered thin film samples.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE Director, Office of Science. Office of Basic Energy Studies (US)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 775128
- Report Number(s):
- LBNL-45807; R&D Project: A58128; TRN: AH200110%%115
- Resource Relation:
- Conference: 11th International Conference on X-ray Absorption Fine Structure, Ako (JP), 07/26/2000--07/31/2000; Other Information: PBD: 2 Jan 2001
- Country of Publication:
- United States
- Language:
- English
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