Nanocrystal Thickness Information from Z-Stem: 3-D Imaging in One Shot
Conference
·
OSTI ID:771410
- ORNL
The authors have applied Atomic Number Contrast Scanning Transmission Electron Microscopy (Z-Contrast STEM) towards the study of colloidal CdSe semiconductor nanocrystals embedded in MEH-PPV polymer films. For typical nanocrystal thicknesses, the image intensity is a monotonic function of thickness. Hence an atomic column-resolved image provides information both on the lateral shape of the nanocrystal, as well as the relative thickness of the individual columns. They show that the Z-Contrast image of a single CdSe nanocrystal is consistent with the predicted 3-D model derived from considering HRTEM images of several nanocrystals in different orientations. They further discuss the possibility of measuring absolute thicknesses of atomic columns if the crystal structure is known.
- Research Organization:
- Oak Ridge National Lab., TN (US)
- Sponsoring Organization:
- USDOE Office of Science (US)
- DOE Contract Number:
- AC05-00OR22725
- OSTI ID:
- 771410
- Report Number(s):
- P00-106827
- Country of Publication:
- United States
- Language:
- English
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