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Penetration depth in YBa{sub 2}Cu{sub 3}O{sub 7} thin films from far-infrared transmission

Journal Article · · Physical Review, B: Condensed Matter
; ; ; ;  [1]; ; ;  [2]
  1. Laboratoire de Physique de la Matiere Condensee (URA CNRS 1437), ENS, 24 Rue Lhomond, 75231 Paris Cedex 05 (France)
  2. Laboratoire de Chimie du Solide et Inorganique Moleculaire (URA CNRS 1495), Universite de RENNES I, 35042 Rennes Cedex (France)
We compare the analytical expressions for the transmission and the surface resistance of a thin superconducting film and we point out the differences and similarities between the two quantities. We show that in the case of the transmission, this single quantity allows a straightforward determination of the electromagnetic penetration depth {lambda}({ital T}{much_lt}{ital T}{sub {ital c}}) at low temperatures. We illustrate this point by transmission measurements at different fixed far-infrared frequencies (4--60 cm{sup {minus}1}) in two purposely very different YBa{sub 2}Cu{sub 3}O{sub 7} thin films. We find 2900 and 2000 A, respectivley, for the absolute value of their electromagnetic penetration depth at {ital T}{much_lt}{ital T}{sub {ital c}}, which suggests an extrinsic origin of the field penetration in these samples. Such an assignment may further clarify the temperature dependence of the penetration depth which has been observed in thin films.
OSTI ID:
76429
Journal Information:
Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 1 Vol. 52; ISSN 0163-1829; ISSN PRBMDO
Country of Publication:
United States
Language:
English