Measurements of the magnetic penetration depth in YBa/sub 2/Cu/sub 3/O/sub 7/minus/delta/ thin films by the microstrip resonator technique

Journal Article · Mon Jun 26 04:00:00 EDT 1989 · Appl. Phys. Lett.; (United States)

DOI:https://doi.org/10.1063/1.101547· OSTI ID:6097200

Anlage, S M; Sze, H; Snortland, H J; Tahara, S; Langley, B; Eom, C; Beasley, M R; Taber, R

We have utilized the superconducting microstrip resonator technique to measure the magnetic penetration depth in high /ital T//sub /ital c// oxide thin films in the 1--25 GHz regime. This technique is particularly well suited for thin films, where the absolute value of the penetration depth can be accurately determined. Results for high /ital T//sub /ital c// superconducting thin films show that the value of the penetration depth is sensitive to the preparation conditions of the film, and the temperature dependence is that expected of conventional superconductors.

• Research Organization: Department of Applied Physics, Stanford University, Stanford, California 94305(US); Superconductivity Group, Hewlett Packard Research Laboratories, Palo Alto, California 94303
• OSTI ID: 6097200
• Journal Information: Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 54:26; ISSN APPLA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360204* -- Ceramics
Cermets
& Refractories-- Physical Properties
656100 -- Condensed Matter Physics-- Superconductivity
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALKALINE EARTH METAL COMPOUNDS
BARIUM COMPOUNDS
BARIUM OXIDES
CHALCOGENIDES
COPPER COMPOUNDS
COPPER OXIDES
DATA
ELECTRONIC EQUIPMENT
EQUIPMENT
EXPERIMENTAL DATA
FILMS
FREQUENCY RANGE
GHZ RANGE
GHZ RANGE 01-100
INFORMATION
MEASURING METHODS
MICROWAVE EQUIPMENT
NUMERICAL DATA
OXIDES
OXYGEN COMPOUNDS
PENETRATION DEPTH
RESONATORS
SUPERCONDUCTORS
THIN FILMS
TRANSITION ELEMENT COMPOUNDS
YTTRIUM COMPOUNDS
YTTRIUM OXIDES