A note on the transition from coupled plasticity and damage to decohesion in the evolution of solder failure
A key issue of solder joint reliability is joint failure due to thermomechanical fatigue (TMF). TMF is caused by different coefficients of thermal expansion (CTEs) of the materials in an electronic package, combined with changes in the ambient temperature. Different CTEs result in cyclical strain in the assembly, and this strain is concentrated almost entirely in the solder because it is the most deformable portion of the package. Since solder alloy is at a significant fraction of its melting point even at room temperature, the cyclical strain enhances mass diffusion and causes dramatic changes in the alloy microstructure over time. As the microstructure changes and becomes coarser, the solder alloy weakens and eventually microcracks nucleate and grow in the joint, leading to component failure. the failure of solder joints is difficult to detect due to the inert nature of the electrical system. If the system is not on for extended periods then failures can not be observed. Therefore it is important to develop an advanced predictive capability which allows scientists and engineers to predict solder degradation and identify reliability problems in aging electronics early.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 754333
- Report Number(s):
- SAND2000-1055J; 0000035229-000; 0000035229-000; TRN: AH200016%%223
- Journal Information:
- Journal of Applied Mechanics, Other Information: Submitted to Journal of Applied Mechanics; PBD: 25 Apr 2000
- Country of Publication:
- United States
- Language:
- English
Similar Records
Computer simulation of solder joint failure
Microstructural evolution during the thermomechanical fatigue of solder joints