Origin of ''capacitance'' in superconducting microbridges
Journal Article
·
· J. Appl. Phys.; (United States)
The geometrical interelectrode capacitances of superconducting microbridges are too small to account for the observed hysteresis in their I-V characteristics. We propose a new model of microbridges in finite voltages, in which the relevant time constant is the supercurrent relaxation time tau/subR/. From an analysis of the experimental I-V curves it follows that tau/subR/ can be identified with the pair relaxation time within a numerical factor. By equating tau/subR//2..pi.. to the time constant C/G of the shunted Josephson junction model, we obtain values of C in reasonable agreement with those typically obtained from I-V characteristics. (AIP)
- Research Organization:
- Department of Physics, University of Southern California, Los Angeles, California 90007
- OSTI ID:
- 7355268
- Journal Information:
- J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 47:6; ISSN JAPIA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ELECTRIC BRIDGES
ELECTRIC CONDUCTIVITY
ELECTRICAL EQUIPMENT
ELECTRICAL PROPERTIES
ELECTRONIC CIRCUITS
EQUIPMENT
HYSTERESIS
JOSEPHSON JUNCTIONS
MICROELECTRONIC CIRCUITS
ORDER PARAMETERS
PHYSICAL PROPERTIES
RELAXATION
SUPERCONDUCTING JUNCTIONS
SUPERCONDUCTIVITY
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ELECTRIC BRIDGES
ELECTRIC CONDUCTIVITY
ELECTRICAL EQUIPMENT
ELECTRICAL PROPERTIES
ELECTRONIC CIRCUITS
EQUIPMENT
HYSTERESIS
JOSEPHSON JUNCTIONS
MICROELECTRONIC CIRCUITS
ORDER PARAMETERS
PHYSICAL PROPERTIES
RELAXATION
SUPERCONDUCTING JUNCTIONS
SUPERCONDUCTIVITY