Heavy-ion-produced high-resolution Si-K-x-ray spectra from a gas and solid. [45-MeV Cl ions: reaction kinetics]

Journal Article · Mon May 03 00:00:00 EDT 1976 · Phys. Rev. Lett.; (United States)

DOI:https://doi.org/10.1103/PhysRevLett.36.1074· OSTI ID:7354630

Kauffman, R L; Jamison, K A; Gray, T J; Richard, P

50Si-K..cap alpha..-x-ray spectra prodced by 45-Meombardment using thin solid Si and SiH/sub 4/ targets are measured. The Si satellite lines shift in energy and change in relative intensity between the solid and gas spectra, these differences indicating that different electronic states are produced in the two collisions. The effective fluorescence yield varies by a factor of 2 between the two systems; such a change affects interpretation of comparisons of heavy-ion-induced x-ray-production cross sections. (AIP)

• Research Organization: Bell Laboratories, Murray Hill, New Jersey 07974
• OSTI ID: 7354630
• Journal Information: Phys. Rev. Lett.; (United States), Vol. 36:18
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
CHLORINE IONS
ION-ATOM COLLISIONS
SILANES
SILICON
CROSS SECTIONS
IONIZATION
MEV RANGE 10-100
REACTION KINETICS
X-RAY SPECTRA
ATOM COLLISIONS
CHARGED PARTICLES
COLLISIONS
ELEMENTS
ENERGY RANGE
HYDRIDES
HYDROGEN COMPOUNDS
ION COLLISIONS
IONS
KINETICS
MEV RANGE
SEMIMETALS
SILICON COMPOUNDS
SPECTRA
640304* - Atomic
Molecular & Chemical Physics- Collision Phenomena