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Thermal magnetoresistance of potassium

Technical Report ·
DOI:https://doi.org/10.2172/7349675· OSTI ID:7349675
The thermal magnetoresistance of single and polycrystalline specimens of potassium having residual resistance ratios (RRR) ranging from 1100 to 5300, was measured between 2 and 9/sup 0/K for magnetic fields up to 1.8T. The observed thermal magnetoresistance cannot be understood on the basis of either semiclassical theories or from the electrical magnetoresistance and the Weidmann--Franz law. The thermal magnetoresistance, W(T,H), is given reasonably well by W(T,H)T = W(T,O)T + AH + BH/sup 2/ where both A and B are temperature-dependent coefficients. The results show that A = A/sub 0/ + A/sub 1/T/sup 3/ while B(T) cannot be expressed as any simple power law. A/sub 0/ is quite dependent upon the RRR while A/sub 1/ is independent of the RRR. Two interesting relations were found between corresponding coefficients in the electrical and thermal magnetoresistance: (1) the Weidmann--Franz law relates A/sub 0/ to the Kohler slope of the electrical magnetoresistance and (2) the temperature-dependent portions of the electrical and thermal Kohler slopes are both proportional to the electron--phonon scattering contribution to the corresponding zero-field resistance. This is evidence that inelastic scattering is very important in determining the temperature-dependent linear magnetoresistances. Part, but by no means all, of the quadratic thermal resistance is accounted for by lattice thermal conduction. After subtracting the lattice contribution, the Lorentz ratio is still strongly field dependent, decreasing with increasing field. The general conclusion is made that at least a portion of the anomalous electrical and thermal magnetoresistances is due to intrinsic causes and not inhomogeneities or other macroscopic defects.
Research Organization:
Cincinnati Univ., OH (USA). Dept. of Physics; Cornell Univ., Ithaca, NY (USA). Lab. of Atomic and Solid State Physics
OSTI ID:
7349675
Report Number(s):
COO-3150-36
Country of Publication:
United States
Language:
English