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Barrier-thickness dependence of the dc quantum interference effect in thin-film lead Josephson junctions

Conference · · J. Appl. Phys.; (United States)
OSTI ID:7349345
;

None

Research Organization:
Army Electronics Command, Fort Monmouth, N. J.
NSA Number:
NSA-23-30492
OSTI ID:
7349345
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 40; ISSN JAPIA
Country of Publication:
United States
Language:
English

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Related Subjects

420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
COHERENT SCATTERING
CRITICAL CURRENT
CURRENTS
DIFFRACTION
DIMENSIONS
ELECTRIC CONDUCTIVITY
ELECTRIC CURRENTS
ELECTRICAL PROPERTIES
ELEMENTS
FILMS
INTERFERENCE
JOSEPHSON EFFECT
JOSEPHSON JUNCTIONS
LAYERS
LEAD
MAGNETIC FIELDS
MECHANICS
METALS
PHYSICAL PROPERTIES
QUANTUM MECHANICS
SCATTERING
STABILITY
SUPERCONDUCTING JUNCTIONS
SUPERCONDUCTIVITY
THICKNESS
WAVE PROPAGATION