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BARRIER-THICKNESS DEPENDENCE OF THE DC QUANTUM INTERFERENCE EFFECT IN THIN- FILM LEAD JOSEPHSON JUNCTIONS.

Journal Article · · J. Appl. Phys., 40: 2123-7(Apr. 1969).
DOI:https://doi.org/10.1063/1.1657934· OSTI ID:4768186
;

Research Organization:
Army Electronics Command, Fort Monmouth, N. J.
Sponsoring Organization:
USDOE
NSA Number:
NSA-23-030492
OSTI ID:
4768186
Journal Information:
J. Appl. Phys., 40: 2123-7(Apr. 1969)., Journal Name: J. Appl. Phys., 40: 2123-7(Apr. 1969).
Country of Publication:
Country unknown/Code not available
Language:
English

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Related Subjects

BARRIERS
CRITICAL CURRENTS
CURRENTS
DIFFRACTION
FILMS
INTERFERENCE
JOSEPHSON EFFECT
JUNCTIONS
LAYERS
LEAD
LEAD/superconducting Josephson junctions of
barrier- thickness dependence of quantum interference effect in
MAGNETIC FIELDS
N32720* --Physics (Low Temperature)--Superconductivity
QUANTUM MECHANICS
STABILITY
SUPERCONDUCTIVITY
SUPERCONDUCTORS/quantum interference effect in thin film Josephson-junction
barrier-thickness dependence of
THICKNESS
WAVE PROPAGATION