skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Concentration profiles of passive films formed on niobium metal and niobium-base alloys by Auger electron spectrometry. [Nb--10 Ti--3 Zr; Nb--5 Zr; Nb--5Mo--5V--1Zr; Nb--2W--2. 5 Zr]

Journal Article · · Mater. Res. Bull.; (United States)

Concentration profiles of passive films formed on electrolytically anodized niobium and niobium-base alloys are obtained by Auger Electron Spectroscopy with simultaneous ion beam etching. The alloys investigated include 5Zr-Nb, 3Zr-10Ti-Nb, 2.5Zr-2W-Nb, and 1Zr-5Mo-5V-Nb. Experiments demonstrate that AES is among the most fascinating techniques for solving various characterization problems related to the structure and composition of the thin films formed by anodization. Data presented supports evidence that combined anodic and cathodic movements take place during film growth. 11 figures.

OSTI ID:
7337884
Journal Information:
Mater. Res. Bull.; (United States), Vol. 11:5, Issue 5
Country of Publication:
United States
Language:
English