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Influence of biased magnetron deposition parameters on amorphous Gd--Co--Cu properties

Journal Article · · J. Vac. Sci. Technol.; (United States)
DOI:https://doi.org/10.1116/1.569105· OSTI ID:7317870

Biased magnetron sputtering has been used to deposit amorphous GdCoCu films from a Gd/sub 15/Co/sub 38/Cu/sub 47/ target. The effects of target current, sputtering pressure, and substrate-bias voltage have been determined. The uniaxial anisotropy energy K/sub u/ may be varied from 0.07 x 10/sup 5/ erg/cm/sup 3/ to 4.0 x 10/sup 5/ erg/cm/sup 3/ while the quality factor Q=K/sub u//(2..pi..M/sup 2/) may be varied from 0.6 to 7.9. In varying these parameters the film compositions are maintained at approximately the target composition, while similar parameter variations in diode sputtering engender compositional changes far greater. Thus, it is shown that magnetron sputtering offers a control of film properties that is unattainable with other deposition techniques.

Research Organization:
IBM Research Laboratory, San Jose, California 95193
OSTI ID:
7317870
Journal Information:
J. Vac. Sci. Technol.; (United States), Journal Name: J. Vac. Sci. Technol.; (United States) Vol. 14:1; ISSN JVSTA
Country of Publication:
United States
Language:
English