Ion current reduction in pinched electron beam diodes

Journal Article · Wed Jun 01 04:00:00 EDT 1977 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.324040· OSTI ID:7312879

Quintenz, J P; Poukey, J W

A new version of a particle-in-cell diode code has been written which permits the accurate treatment of higher-current diodes with greater physical dimensions. Using this code, we have studied ways to reduce the ion current in large-aspect-ratio pinched electron beam diodes. In particular, we find that allowing the ions to reflex in such diodes lowers the ion to electron current ratio considerably. In a 3-MV R/d=24 case this ratio was lowered by a factor of 6--8 compared with the corresponding nonreflexing-ion diode, while still producing a superpinched electron beam.

• Research Organization: Plasma Theory Division : 5241, Sandia Laboratories, Albuquerque, New Mexico 87115
• OSTI ID: 7312879
• Journal Information: J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 48:6; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
700105* -- Fusion Energy-- Plasma Research-- Plasma Kinetics-Theoretical-- (-1987)
BEAM CURRENTS
BEAM-PLASMA SYSTEMS
BEAMS
CHARGED PARTICLES
COMPUTER CODES
CURRENTS
ELECTRON BEAMS
ENERGY RANGE
IONS
LEPTON BEAMS
PARTICLE BEAMS
PINCH EFFECT
PLASMA SIMULATION
RELATIVISTIC RANGE