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Electrical properties of TlBiTe/sub 2/ between 295 and 4. 2k

Technical Report ·
OSTI ID:7311477
The electrical resistivity rho and the weak-field Hall coefficient R(o) were measured between 295 and 4.2K on polycrystalline TlBiTe2. At 170K, rho and R(o) abruptly changed by factors of 1.2 and 3, respectively. Otherwise, R(o) was approximately constant, with values of +3 and +10 x 10 to the -3rd power cc/C at 295 and 4.2K, and rho decreased steadily with decreasing temperature, showing little or no tendency to approach a constant residual resistance level. The Hall mobilities were about 4 and 1200 sq cm/V-sec at 295 and 4.2K, respectively. Interpretations of the data in terms of a highly extrinsic p-type semiconductor or a semimetal are considered, and their relation to the superconducting transition discovered by Hein and Swiggard is discussed.
Research Organization:
Naval Ordnance Lab., White Oak, MD (USA)
OSTI ID:
7311477
Report Number(s):
AD-734734
Country of Publication:
United States
Language:
English