Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Substrate-epitaxial layer interface effects on AlGaAs/GaAs heterostructure device properties

Journal Article · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States)
DOI:https://doi.org/10.1116/1.585382· OSTI ID:7305832
; ; ;  [1];  [2]
  1. AT and T Bell Labs., Reading, PA (United States)
  2. AT and T Bell Labs., Murray Hill, NJ (United States)

Device characteristics of AlGaAs/GaAs heterostructure field effect transistors fabricated by molecular-beam epitaxial growth are related to the condition of the substrate-epitaxial layer interface. The presence of carbon on the GaAs wafer surface prior to growth has been found to produce a p-type, conducting interfacial region. The authors demonstrate that the concentration of carbon on the wafer surface can be significantly reduced by exposing the wafers to ultraviolet radiation. Depletion- and enhancement-mode device transfer characteristics and transfer characteristics and transconductance curves have been obtained on heterostructure wafers that were subjected to an ultraviolet-ozone surface preparation. A comparison of these results with the device properties of wafers receiving a standard cleaning procedure is presented. A model describing the interaction between the interfacial p-type region and the two-dimensional electron gas channel is also included.

OSTI ID:
7305832
Journal Information:
Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States), Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States) Vol. 9:4; ISSN 0734-211X; ISSN JVTBD
Country of Publication:
United States
Language:
English